The Walther-Meißner-Institute will acquire an X-ray/Ultraviolet Photoelectron Spectroscopy (XPS/UPS) system for the characterization of metallic, semiconducting, and insulating thin films, and bulk materials. This includes the characterization of substrate surfaces, characterization of oxide layers by measuring the chemical shift and valence state, determining the oxide layer thickness using angle-resolved XPS, stoichiometry analysis of thin film samples, depth profiling of chemical composition,

Contract type	Supplies
CPV	38000000
Deadline	30 May 2025

Full tender details, bidder list, market context and related contracts available below. Data sourced from TED — the Official Journal of the EU.