🇩🇪 Germany · EU Public Tender

Xenonbasiertes Focused Ion Beam Rasterelektronen-Mikroskop (FIB-REM) mit integrierter RAMAN-Spektroskopie

🏛️ Lehrstuhl für Fertigungsautomatisierung und Produktionssystematik · 📍 Erlangen
1 €
Estimated value
—
Deadline
Contract typeSupplies
CPV38511100
Awarded toTESCAN GmbH
Full tender details, bidder list, market context and related contracts available below. Data sourced from TED — the Official Journal of the EU.
⚠️
Tender not found
This tender does not exist or has been removed.
← Back to tenders
Interested in this contract?
Browse related tenders across Europe.
All tenders Market intel →